Non-destructive optical characterization of the surface region in bulk semiconductors and heterostructures

Author： Mizeikis V.   Jarasiunas K.   Lovergine N.   Kuroda K.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.364, Iss.1, 2000-03, pp. : 186-191

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