Photoluminescence characterization of non-radiative defect density on silicon surfaces and interfaces at room temperature

Author: Timoshenko V.Y.   Petrenko A.B.   Dittrich T.   Fussel W.   Rappich J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.364, Iss.1, 2000-03, pp. : 196-199

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract