On the enlargement of the lattice parameter c in sputter deposited in situ prepared thin films of YBa 2 Cu 3 O x

By Aswal D.K.   Gupta S.K.   Narang S.N.   Sabharwal S.C.   Gupta M.K.  

Thin Solid Films, Vol. 292, Iss. 1, 1997-01 ,pp. : 277-281

Elsevier

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Preparation of (001)- and (114)-oriented epitaxial thin films of Bi 2 VO 5.5 by a coating pyrolysis process

By Tsukada K.   Nagahama T.   Sohma M.   Yamaguchi I.   Manabe T.   Tsuchiya T.   Suzuki S.   Shimizu T.   Mizuta S.   Kumagai T.  

Thin Solid Films, Vol. 425, Iss. 1, 2003-02 ,pp. : 97-102

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Characterization of epitaxial thin films of Bi 2 VO 5.5 on La-doped SrTiO 3 substrates prepared by coating-pyrolysis process

By Tsukada K.   Nagahama T.   Sohma M.   Yamaguchi I.   Manabe T.   Tsuchiya T.   Suzuki S.   Shimizu T.   Mizuta S.   Kumagai T.  

Thin Solid Films, Vol. 422, Iss. 1, 2002-12 ,pp. : 73-79

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A comparison between V 2 O 5 and WO 3 thin films as sensitive elements for NO detection

By Capone S.   Rella R.   Siciliano P.   Vasanelli L.  

Thin Solid Films, Vol. 350, Iss. 1, 1999-08 ,pp. : 264-268

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RTA and stoichiometry effect on the thermochromism of VO 2 thin films

By Lee M.-H.   Kim M.-G.  

Thin Solid Films, Vol. 286, Iss. 1, 1996-09 ,pp. : 219-222

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