ESR investigations of modulation-doped Si/SiGe quantum wells

Author: Sandersfeld N.   Jantsch W.   Wilamowski Z.   Schaffler F.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.369, Iss.1, 2000-07, pp. : 312-315

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Abstract