Optical properties of CuAlX 2 (X=Se, Te) thin films obtained by annealing of copper, aluminum and chalcogen layers sequentially deposited

Author: El Moctar C.O.   Kambas K.   Marsillac S.   Anagnostopoulos A.   Bernede J.C.   Benchouck K.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.371, Iss.1, 2000-08, pp. : 195-200

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Abstract