Structural study of Ni 80 Fe 20 /Cu multilayers by X-ray diffraction

Author: Xu M.   Chai C.   Luo G.   Yang T.   Mai Z.   Lai W.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.375, Iss.1, 2000-10, pp. : 205-209

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract