Investigations of Fuch-Kliewer phonons and hydrogen adsorption of 6H-SiC surfaces by high-resolution electron-energy-loss spectroscopy

Author： Liu J.W.   Xie F.Q.   Zhang Q.Z.   Wu K.H.   Ma X.C.   Wang E.G.   Liu W.X.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.375, Iss.1, 2000-10, pp. : 77-81

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

High-resolution transmission electron microscopy and electron-energy-loss spectroscopy study of the phase Mg 2 Zr 5 O 12 in MgO-partially stabilized zirconia

By Liu Z.   Spargo A. E. C.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 81, Iss. 3, 2001-03 ,pp. : 625-636

Taylor & Francis Ltd

Access to resources Recommend Favorite

High-resolution observation of basal-plane C-core edge dislocations in 4H-SiC crystal by transmission electron microscopy

By Matsuhata Hirofumi  

Philosophical Magazine, Vol. 92, Iss. 31, 2012-11 ,pp. : 3780-3788

Taylor & Francis Ltd

Access to resources Recommend Favorite

Structural and chemical analysis of a model Si-SiO 2 interface using spatially resolved electron-energy-loss spectroscopy

By Cheynet M. C.  

Philosophical Magazine, Vol. 84, Iss. 17, 2004-06 ,pp. : 1753-1771

Taylor & Francis Ltd

Access to resources Recommend Favorite

Anger and energy loss spectroscopy analysis of silicon carbide (SiC) surfaces

By Ghamnia M.   Jardin C.   Kadri D.   Bouslama M.  

Vacuum, Vol. 47, Iss. 2, 1996-02 ,pp. : 141-143

Elsevier

Access to resources Recommend Favorite

High-resolution electron energy loss spectroscopy of thin crystalline highly oriented films of poly(tetrafluoroethylene)

By Schott M.   Rei Vilar M.   Dannetun P.  

Thin Solid Films, Vol. 286, Iss. 1, 1996-09 ,pp. : 321-329

Elsevier

Access to resources Recommend Favorite