Boron surface phase on Si(111): atomic structure and Si overgrowth studied by scanning tunneling microscopy and work function measurement

Author： Stimpel T.   Hoster H.E.   Schulze J.   Baumgartner H.   Eisele I.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.380, Iss.1, 2000-12, pp. : 29-31

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