The effect of ZrO 2 buffer layer on electrical properties in Pt/SrBi 2 Ta 2 O 9 /ZrO 2 /Si ferroelectric gate oxide structure

Author： Choi H.S. Kim E.H. Choi I.-H. Kim Y.T. Choi J.H. Lee J.Y.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.388, Iss.1, 2001-06, pp. : 226-230

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