Characterization of extended defects in polycrystalline CdTe thin films grown by close-spaced sublimation

Author： Yan Y.   Al-Jassim M.M.   Jones K.M.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.389, Iss.1, 2001-06, pp. : 75-77

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