X-Ray diffraction line broadening by stacking faults in SrBi 2 Nb 2 O 9 /SrTiO 3 epitaxial thin films

Author: Boulle A.   Legrand C.   Guinebretiere R.   Mercurio J.P.   Dauger A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.391, Iss.1, 2001-07, pp. : 42-46

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Abstract