Structural characterization of TiO 2 films obtained by high temperature oxidation of TiC single crystals

Author: Bellucci A.   Di Pascasio F.   Gozzi D.   Loreti S.   Minarini C.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.405, Iss.1, 2002-02, pp. : 1-10

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Abstract