In situ X-ray fluorescence used for real-time control of CuIn x Ga 1-x Se 2 thin film composition

Author: Eisgruber I.L.   Joshi B.   Gomez N.   Britt J.   Vincent T.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.408, Iss.1, 2002-04, pp. : 64-72

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Abstract