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Author: Gan L. Gomez R.D. Castillo A. Chen P.J. Powell C.J. Egelhoff Jr. W.F.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.415, Iss.1, 2002-08, pp. : 219-223
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
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Characterization of the oxidized indium thin films with thermal oxidation
By Kim E.K. Lee M.-S. Choi W.C. Kim C.K. Min S.-K.
Thin Solid Films, Vol. 279, Iss. 1, 1996-06 ,pp. :