Grazing incidence X-ray diffraction and atomic force microscopy analysis of BaBi 2 Ta 2 O 9 thin films

Author: Mastelaro V.R.   Foschini C.R.   Varela J.A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.415, Iss.1, 2002-08, pp. : 57-63

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Abstract