Author: Zampiceni E. Bontempi E. Sberveglieri G. Depero L.E.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.418, Iss.1, 2002-10, pp. : 16-20
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Investigation of characteristic properties of Pr-doped SnO2 thin films
By Turgut G.
Philosophical Magazine, Vol. 95, Iss. 14, 2015-05 ,pp. :
By Bernardi M.I.B. Soledade L.E. Santos I.A. Leite E.R. Longo E. Varela J.A.
Thin Solid Films, Vol. 405, Iss. 1, 2002-02 ,pp. :
Dislocations in nanocrystalline SnO2 thin films
By Zheng J. G. Pan X. Schweizer M. Weimar U. Gopel W. Ruhle M.
Philosophical Magazine Letters, Vol. 73, Iss. 3, 1996-03 ,pp. :
Properties and mechanism study of Ag doped SnO 2 thin films as H 2 S sensors
Thin Solid Films, Vol. 304, Iss. 1, 1997-07 ,pp. :