Thickness-dependence of stoichiometry and microstructure characteristics in correlation with conductivity type of CdTe films

Author： Ramadan A.A.   Abd-El Mongy A.   Ahmed Farag I.S.   El-Shabiny A.M.   Radwan F.A.   Ismail H.I.   Hashem H.M.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.423, Iss.2, 2003-01, pp. : 146-152

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