Determination of optical constants of Cd 1-x Zn x Te thin films by spectroscopic ellipsometry

Author: Prabakar K.   Sridharan M.   Narayandass S.K.   Mangalaraj D.   Gopal V.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.424, Iss.1, 2003-01, pp. : 66-69

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Abstract