Determination of the nature of principal scattering mechanism in well-annealed vacuum deposited thin films of the ternary thermoelectric material Bi 2 (Te 0.8 Se 0.2 ) 3

Author： Damodara Das V.   Chandra Mallik R.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.424, Iss.1, 2003-01, pp. : 75-78

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