Grazing incidence X-ray diffraction and atomic force microscopy analysis of BaBi 2 Ta 2 O 9 thin films

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Thin Solid Films, Vol. 415, Iss. 1, 2002-08 ,pp. : 57-63

Elsevier

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Atomic force microscopy observations of successive damaging mechanisms of thin films on substrates under tensile stress

By George M.   Coupeau C.   Colin J.   Grilhe J.  

Thin Solid Films, Vol. 429, Iss. 1, 2003-04 ,pp. : 267-272

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Structural and morphological characterisation of ruthenium phthalocyanine films by energy dispersive X-ray diffraction and atomic force microscopy

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Thin Solid Films, Vol. 382, Iss. 1, 2001-02 ,pp. : 74-80

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An X-ray diffraction (XRD) study of vapor deposited gold thin films on aluminum nitride (AlN) substrates

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Rutherford backscattering spectrometry, particle induced X-ray emission and atomic force microscopy of InAs thin films grown on GaAs: A complementary study

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