Fabrication of vanadium oxide thin film with high-temperature coefficient of resistance using V 2 O 5 /V/V 2 O 5 multi-layers for uncooled microbolometers

Author: Han Y.-H.   Choi I.-H.   Kang H.-K.   Park J.-Y.   Kim K.-T.   Shin H.-J.   Moon S.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.425, Iss.1, 2003-02, pp. : 260-264

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Abstract