Meyer-Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?

Author： Pichon L. Mercha A. Routoure J.M. Carin R. Bonnaud O. Mohammed-Brahim T.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.427, Iss.1, 2003-03, pp. : 350-354

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