Thickness dependence of photoemission and X-ray fluorescence spectra in epitaxial NiO layers on Ag(100)

Author： Krasnikov S.A.   Preobrajenski A.B.   Chasse T.   Szargan R.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.428, Iss.1, 2003-03, pp. : 201-205

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