Defect structure of pulsed laser deposited LiNbO 3 /Al 2 O 3 layers determined by X-ray diffraction reciprocal space mapping

Author： Boulle A.   Canale L.   Guinebretiere R.   Girault-Di Bin C.   Dauger A.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.429, Iss.1, 2003-04, pp. : 55-62

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