Correlation between interface structure and giant magnetoresistance in electrodeposited Co-Cu/Cu multilayers

Author: Cziraki A.   Koteles M.   Peter L.   Kupay Z.   Padar J.   Pogany L.   Bakonyi I.   Uhlemann M.   Herrich M.   Arnold B.   Thomas J.   Bauer H.D.   Wetzig K.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.433, Iss.1, 2003-06, pp. : 237-242

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract