CO sensitivity of the PtO/SnO 2 and PdO/SnO 2 layer structures: Kelvin probe and XPS analysis

Author： Kiss G.   Josepovits V.K.   Kovacs K.   Ostrick B.   Fleischer M.   Meixner H.   Reti F.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.436, Iss.1, 2003-07, pp. : 115-118

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