Correlation of Raman and X-ray diffraction measurements of annealed pulsed laser deposited ZnO thin films

Author: Roy C.   Byrne S.   McGlynn E.   Mosnier J.-P.   de Posada E.   O'Mahony D.   Lunney J.G.   Henry M.O.   Ryan B.   Cafolla A.A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.436, Iss.2, 2003-07, pp. : 273-276

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Abstract