Simultaneous measurement of spectral optical properties and thickness of an absorbing thin film on a substrate

By Chen J.-J.   Lin J.-D.   Sheu L.-J.  

Thin Solid Films, Vol. 354, Iss. 1, 1999-10 ,pp. : 176-186

Elsevier

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FIB micromachined submicron thickness cantilevers for the study of thin film properties

By McCarthy J.   Pei Z.   Becker M.   Atteridge D.  

Thin Solid Films, Vol. 358, Iss. 1, 2000-01 ,pp. : 146-151

Elsevier

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Measuring mechanical properties of thin flexible films by a shaft-loaded blister test

By Wan K.-t.   Liao K.  

Thin Solid Films, Vol. 352, Iss. 1, 1999-09 ,pp. : 167-172

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The influence of TiB 2 -thin film thickness on metal-GaAs structural characteristics

By Kryshtab T.G.   Palacios Gomez J.   Lytvyn P.M.   Lytvyn O.S.  

Thin Solid Films, Vol. 373, Iss. 1, 2000-09 ,pp. : 79-83

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Electron beam initiated oxidation and coalescence of metal particles embedded in a plasma-polymer thin film matrix

By Heilmann A.   Muller A.D.   Werner J.   Muller F.  

Thin Solid Films, Vol. 270, Iss. 1, 1995-12 ,pp. : 351-355

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