Combinatorial approach to the edge delamination test for thin film reliability-concept and simulation

Author： Chiang M.Y.M.   Wu W.-l.   He J.   Amis E.J.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.437, Iss.1, 2003-08, pp. : 197-203

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