Author: Houbertz R. Domann G. Cronauer C. Schmitt A. Martin H. Park J.-U. Frohlich L. Buestrich R. Popall M. Streppel U. Dannberg P. Wachter C. Brauer A.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.442, Iss.1, 2003-10, pp. : 194-200
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Abstract
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