High resolution hydrogen profiling in superconducting materials by ion beam analysis (ERD-EXB)

Author： Roux B. Chevarier A. Chevarier N. Wybourn B. Antoine C. Cantacuzene S. Bosland P. Bonin B.

Publisher： Elsevier

ISSN： 0042-207X

Source： Vacuum, Vol.46, Iss.7, 1995-07, pp. : 629-632

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

High-resolution secondary ion mass spectrometry depth profiling of superconducting thin films

By Montgomery N.J. MacManus-Driscoll J.L. McPhail D.S. Chater R.J. Moeckly B. Char K.

Thin Solid Films, Vol. 317, Iss. 1, 1998-04 ,pp. : 237-240

Elsevier

Access to resources Recommend Favorite

ERD: Hydrogen profiling and application to the lattice expansion study

By Touchrift B. Benouali N. Salah H.

Vacuum, Vol. 47, Iss. 1, 1996-01 ,pp. : 35-38

Elsevier

Access to resources Recommend Favorite

Study of the superconducting MgB 2 films by ion beam analysis methods

By Andrade E. Chromik S. Jergel M. Jergel M. Falcony C. Strbk V. Rocha M.F. Zavala E.P.

Thin Solid Films, Vol. 433, Iss. 1, 2003-06 ,pp. : 103-107

Elsevier

Access to resources Recommend Favorite

Materials science education: ion beam modification and analysis of materials

By Zimmerman Robert Muntele Claudiu Ila Daryush

Radiation Effects and Defects in Solids, Vol. 167, Iss. 8, 2012-08 ,pp. : 577-582

Taylor & Francis Ltd

Access to resources Recommend Favorite

Application of ion beam techniques in superconducting electronics

By Tinchev S.S.

Vacuum, Vol. 69, Iss. 1, 2002-12 ,pp. : 17-25

Elsevier

Access to resources Recommend Favorite