Electron elastic scattering study of thin film growth mode : Rh on Al 2 O 3

Author: Matolin V.   Kapsa R.   Nehasil V.   Thiam M.M.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.50, Iss.1, 1998-05, pp. : 147-150

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Abstract