Author: Tomov I. Adamik M. Barna P.B. Yamakov V.
Publisher: Elsevier
ISSN: 0042-207X
Source: Vacuum, Vol.50, Iss.3, 1998-07, pp. : 497-502
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Innovative Residual Stress Measurements by X-Ray Diffraction
Materials Science Forum, Vol. 2015, Iss. 812, 2015-03 ,pp. :
By Roy C. Byrne S. McGlynn E. Mosnier J.-P. de Posada E. O'Mahony D. Lunney J.G. Henry M.O. Ryan B. Cafolla A.A.
Thin Solid Films, Vol. 436, Iss. 2, 2003-07 ,pp. :