Effects of HF attack on the surface and interface microchemistry of W tips for use in the STM microscope: a scanning Auger microscopy (SAM) study

Author： Paparazzo E.   Moretto L.   Selci S.   Righini M.   Farne I.  

Publisher： Elsevier

ISSN： 0042-207X

Source： Vacuum, Vol.52, Iss.4, 1999-04, pp. : 421-426

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