AFM and XPS study of nitrided TiO 2 and SiO 2 -TiO 2 sol-gel derived films

Author: Wicikowski L.   Kusz B.   Murawski L.   Szaniawska K.   Susla B.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.54, Iss.1, 1999-07, pp. : 221-225

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract