Approximate self-affine characterization of two-point rough surface statistics simulated by Eden algorithm

Author: Vulkova L.A.   Atanasov I.S.   Yordanov O.I.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.58, Iss.2, 2000-08, pp. : 158-165

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract