Auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS) studies of GaP and Si surfaces

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Vacuum, Vol. 65, Iss. 2, 2002-04 ,pp. : 193-206

Elsevier

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Structures and electronic states of InAs (001) and (111)B surfaces passivated with sulfur studied by AES, LEED, UPS, XPS, and IPES

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Vacuum, Vol. 67, Iss. 1, 2002-09 ,pp. : 37-41

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Electronic spectroscopy (AES, EELS) and cathodoluminescence (CL) for -Al 2 O 3 characterization

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Vacuum, Vol. 48, Iss. 2, 1997-02 ,pp. : 129-134

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AES and EELS study of aluminium oxide thin films

By Kapsa R.   Stara I.   Zeze D.   Gruzza B.   Matoln V.  

Thin Solid Films, Vol. 317, Iss. 1, 1998-04 ,pp. : 77-80

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Characterization of a barium surface by AES, XPS and SIMS

By Teodoro O.M.N.D.   Moutinho A.M.C.  

Vacuum, Vol. 64, Iss. 3, 2002-01 ,pp. : 431-437

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