

Author: Hrncr T. Matoln V. Nehasil V.
Publisher: Elsevier
ISSN: 0042-207X
Source: Vacuum, Vol.63, Iss.1, 2001-07, pp. : 7-14
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content


Comparison of AES and EXAFS analysis of a thin Cux Aly layer on Al substrate
By Mozetic M. Zalar A. Bogataj T. Arcon
Vacuum, Vol. 50, Iss. 3, 1998-07 ,pp. :


S. F. Kashani‐Bozorg, M. Samiee and A. Honarbakhsh‐Raoof
SURFACE AND INTERFACE ANALYSIS, Vol. 47, Iss. 2, 2015-02 ,pp. :


Characterisation of Rh films deposited onto Al 2 O 3 substrate by means of electron spectroscopy
Vacuum, Vol. 63, Iss. 1, 2001-07 ,pp. :

