Author: Wiesendanger R.
Publisher: Elsevier
ISSN: 0042-207X
Source: Vacuum, Vol.65, Iss.2, 2002-04, pp. : 235-236
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Combinatorial Chemistry & High Throughput Screening, Vol. 13, Iss. 6, 2010-07 ,pp. :
Nano- to microscale wear and mechanical characterization using scanning probe microscopy
By Bhushan B.
Wear, Vol. 251, Iss. 1, 2001-10 ,pp. :