Author: Gulbinski W. Suszko T. Pailharey D.
Publisher: Elsevier
ISSN: 0043-1648
Source: Wear, Vol.254, Iss.10, 2003-07, pp. : 988-993
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Spectroscopic ellipsometry investigation of V 2 O 5 nanocrystalline thin films
By Losurdo M. Barreca D. Bruno G. Tondello E.
Thin Solid Films, Vol. 384, Iss. 1, 2001-03 ,pp. :
Surface and electrical studies of CuO:V 2 O 5 thin films
By Gopalakrishnan R. Chowdari B.V.R. Tan K.L. Radhakrishnan K.
Thin Solid Films, Vol. 260, Iss. 2, 1995-05 ,pp. :