The local defect index up to finite ambiguity

Author: Bechtluft-Sachs S.   Hien M.  

Publisher: Elsevier

ISSN: 0166-8641

Source: Topology and its Applications, Vol.119, Iss.2, 2002-04, pp. : 113-116

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract