Scanning near-field optic/atomic-force microscopy

Author: Muramatsu H.   Chiba N.   Ataka T.   Monobe H.   Fujihira M.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.57, Iss.2, 1995-02, pp. : 141-146

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract