Author： de Hollander R.B.G. van Hulst N.F. Kooyman R.P.H.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.57, Iss.2, 1995-02, pp. : 263-269
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Scanning near-field optic/atomic-force microscopy
By Muramatsu H. Chiba N. Ataka T. Monobe H. Fujihira M.
Ultramicroscopy, Vol. 57, Iss. 2, 1995-02 ,pp. :
Access to resources
Recommend
Determination of the shear force magnitude in near-field scanning optical microscopy
Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. :
Study of shear force technique for near-field microscopy with an uncoated fiber tip
By Vohnsen B. Bozhevolnyi S. Olesen R.
Ultramicroscopy, Vol. 61, Iss. 1, 1995-12 ,pp. :