Measurement of low-order structure factors for silicon from zone-axis CBED patterns

Author： Saunders M.   Bird D.M.   Zaluzec N.J.   Burgess W.G.   Preston A.R.   Humphreys C.J.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.60, Iss.2, 1995-09, pp. : 311-323

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