A model for the mechanism of field interaction at silicon AFM tips in photon tunneling transfer

Author: Fillard J.-P.   Castagne M.   Prioleau C.   Benfedda M.   Bonnafe J.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.61, Iss.1, 1995-12, pp. : 85-89

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Abstract