Author： Van Dyck D. Lichte H. van der Mast K.D.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.64, Iss.1, 1996-08, pp. : 1-15
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
Towards sub-0.5A electron beams
By Krivanek O.L. Nellist P.D. Dellby N. Murfitt M.F. Szilagyi Z.
Ultramicroscopy, Vol. 96, Iss. 3, 2003-09 ,pp. :
Towards sub-&unknown;9 electron beams
By Krivanek O.L. Dellby N. Lupini A.R.
Ultramicroscopy, Vol. 78, Iss. 1, 1999-06 ,pp. :
Towards sub-nanometer scale EELS analysis of polymers in the TEM
By Varlot K. Martin J.M. Quet C. Kihn Y.
Ultramicroscopy, Vol. 68, Iss. 2, 1997-06 ,pp. :
One step further towards real high-throughput functional genomics
Trends in Biotechnology, Vol. 21, Iss. 4, 2003-04 ,pp. :