Author： Bonnet R. Loubradou M.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.69, Iss.4, 1997-10, pp. : 241-257
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
Plasmons in nanoscale and atomic-scale systems
Science and Technology of Advanced Materials, Vol. 11, Iss. 5, 2010-10 ,pp. :
Access to resources
Scanning near-field optic/atomic-force microscopy
By Muramatsu H. Chiba N. Ataka T. Monobe H. Fujihira M.
Ultramicroscopy, Vol. 57, Iss. 2, 1995-02 ,pp. :
Three-dimensional atomic scale microscopy with the atom probe
By Menand A. Cadel E. Pareige C. Blavette D.
Ultramicroscopy, Vol. 78, Iss. 1, 1999-06 ,pp. :