ASIC-based event-driven 2D digital electron counter for TEM imaging

Author： Fan G.Y. Datte P. Beuville E. Beche J.-F. Millaud J. Downing K.H. Burkard F.T. Ellisman M.H. Xuong N.-H.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.70, Iss.3, 1998-01, pp. : 107-113

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