Effects of relative humidity and applied force on atomic force microscopy images of the filamentous phage fd

Author: Ji X.   Oh J.   Keith Dunker A.   Hipps K.W.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.72, Iss.3, 1998-05, pp. : 165-176

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Abstract