Author: Lopez-Cartes C. Perez-Omil J.A. Pintado J.M. Calvino J.J. Kang Z.C. Eyring L.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.80, Iss.1, 1999-08, pp. : 19-39
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Abstract